Optical properties of a-As2Se3 thin films

Abstract

 Chalcogenide glassy semiconductors currently have found widely applications in the opto-and microelectronics devices. On this work we studied the optical properties of amorphous a-As2Se3 thin films which were produced on the quartz substrate by thermal evaporation method with different thickness: 500 nm, 1000 nm, 2000 nm. The transmission spectra were measured by spectrophotometer in the spectral range 250 -1000 nm. It is known that Swanepoel method can be used to determine the frequency dependent refractive index of thin films via interference fringes of transmission spectra. Using the obtained transmission spectrum and Swanepoel’s method we calculated the optical constants of a- As2Se3 thin films in the 700 – 900 nm wavelength range. The found optical constants of a-As2Se3 films were used to theoretically determine the transmission spectrum by the matrix transfer method (TMM). The comparison of theoretical and experimental values of transmittance was made and proved the practical usage of these methods.

      G M T   Английский Испанский Итальянский Казахский Китайский Трад Китайский Упр Корейский Русский Турецкий Французский   Английский Испанский Итальянский Казахский Китайский Трад Китайский Упр Корейский Русский Турецкий Французский                 Звуковая функция ограничена 200 символами     Настройки : История : Обратная связь : Donate Закрыть