GOLIKOV, O.; YEREZHEP, D.; YERLANOV, T. A semi-automatic examination of CO2 structures in thin films at low temperatures. International Journal of Mathematics and Physics, [S. l.], v. 14, n. 1, p. 53–60, 2023. DOI: 10.26577/ijmph.2023.v14.i1.06. Disponível em: https://ijmph.kaznu.kz/index.php/kaznu/article/view/542. Acesso em: 23 nov. 2024.